An atomic force microscope (AFM) is a type of scanning probe microscope that can be operated in several ways, such as using a laser focused on a cantilever to measure the bending of the tip, or measuring the height needed to maintain a constant current as a probe is passed above the specimen. AFM is valuable for observing specimens at the atomic level and has the advantage of being more easily used with nonconducting samples compared to the scanning tunneling microscope.

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Scanning probe microscopy is a technique that does not use light or electrons to observe a specimen, but rather utilizes very sharp probes that are passed over the specimen's surface and interact with it directly. This produces information that can be assembled into images with magnifications ranging from $${}100	imes$$ to $${}100,000,000	imes$$ or more, allowing for the observation of individual atoms. Because of this high resolution and complexity, scanning probe microscopes have primarily been used for research rather than for clinical diagnostics. The two main types of scanning probe microscopes are the scanning tunneling microscope (STM) and the atomic force microscope (AFM).

Scanning Probe Microscopy

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Microbiology covers the scope and sequence requirements for a single-semester microbiology course for non-majors. The book presents the core concepts of microbiology with a focus on applications for careers in allied health. The pedagogical features of the text make the material interesting and accessible while maintaining the career-application focus and scientific rigor inherent in the subject matter. Microbiology’s art program enhances students’ understanding of concepts through clear and effective illustrations, diagrams, and photographs.

Microbiology is produced through a collaborative publishing agreement between OpenStax and the American Society for Microbiology Press. The book aligns with the curriculum guidelines of the American Society for Microbiology.

OpenStax Microbiology Textbook

A scanning tunneling microscope (STM) is a type of scanning probe microscope that functions by passing a probe horizontally at a constant distance just above the specimen while measuring the intensity of the current. This technique can map the surface structure at the atomic level. STM is most effective on conducting materials, but it can also be used to examine organic materials, such as DNA, if they are fixed onto a surface.

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