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Scanning Probe Microscopy
Scanning probe microscopy is a technique that does not use light or electrons to observe a specimen, but rather utilizes very sharp probes that are passed over the specimen's surface and interact with it directly. This produces information that can be assembled into images with magnifications ranging from to or more, allowing for the observation of individual atoms. Because of this high resolution and complexity, scanning probe microscopes have primarily been used for research rather than for clinical diagnostics. The two main types of scanning probe microscopes are the scanning tunneling microscope (STM) and the atomic force microscope (AFM).

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